Electronic Measuring Instruments Products Test Systems Products Handlers Products Support Customer Support Memory Test System T5586 Achieve High Speed of DDR-SDRAMs and Jitter T5585 simultaneously Tests of 128 SDRAMs at 500MHz The T5586 and T5585 achieve simultaneous testing of 128 memory devices at high throughput at clock speeds up to 500MHz (DDR Mode). They have also achieved stable heat efficiency and high accuracy timing through the use of our unique cooling system. T5586 By using a Tracing check function, it achieves highspeed testing of memory devices with jitter. T5585 Achieves testing of memory devices such as SDRAMs at high throughput.   T5586 T5586 Target Devices DDR-SDRAM, SSRAM, etc. SDRAM, SSRAM, etc. Test Speed 250/500MHz (DDR mode) Simultaneous Testing Up to 128 devices Products

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